J. PUSHPARANI, V. A. ,. Optimized Test compression bandwidth management for Ultra-large-Scale System-on-Chip Architectures performing Scan Test Bandwidth Management. International Journal of Engineering and Computer Science, india, v. 5, n. 10, 2016. Disponível em: https://ijecs.in/index.php/ijecs/article/view/2681. Acesso em: 18 may. 2024.