BABU, R N V L H MADHURI, D. , V. Dynamic Analysis for Simulating the Effect of Power Quality on Sensitive Electronic Equipment. International Journal of Engineering and Computer Science, india, v. 6, n. 6, 2017. Disponível em: http://ijecs.in/index.php/ijecs/article/view/3012. Acesso em: 2 may. 2024.